Vishay Siliconix
Power MOSFET
PRODUCT SUMMARY
VDS (V)
RDS(on) (Max.) (Ω)Qg (Max.) (nC)Qgs (nC)Qgd (nC)Configuration
VGS = 10 V
246.311Single
DFEATURES
500
1.40
•Low Gate Charge Qg Results in Simple DriveRequirement
•Improved Gate, Avalanche and Dynamic dV/dtRuggedness
AvailableRoHS*COMPLIANT•Fully Characterized Capacitance and Avalanche Voltageand Current
•Effective Coss specified•Lead (Pb)-free Available
I2PAK (TO-262)D2PAK (TO-263)APPLICATIONS
•Switch Mode Power Supply (SMPS)
G•Uninterruptible Power Supply•High speed power switching
SDGGDSSN-Channel MOSFET TYPICAL SMPS TOPOLOGIES
•Two Transistor Forward•Half Bridge and Full Bridge
ORDERING INFORMATION
PackageLead (Pb)-freeSnPb
Note
a.See device orientation.
D2PAK (TO-263)IRF830ASPbFSiHF830AS-E3IRF830ASSiHF830AS
D2PAK (TO-263)IRF830ASTRLPbFaSiHF830ASTL-E3aIRF830ASTRLaSiHF830ASTLa
I2PAK (TO-262)IRF830ALPbFSiHF830AL-E3 IRF830ALSiHF830AL
ABSOLUTE MAXIMUM RATINGS TC = 25 °C, unless otherwise noted
PARAMETER SYMBOLNLIMITUIT
500Drain-Source Voltage VDS
V
30Gate-Source VoltageVGS ± TC = 25 °C 5.0Continuous Drain CurrentVGS at 10 VID
3.2TC = 100 °C A
a, eIDM 20Pulsed Drain Current
Linear Derating Factor0.59W/°C
EAS 230mJ Single Pulse Avalanche Energyb, eaIAR 5.0AAvalanche Current
aEAR 7.4mJ Repetiitive Avalanche Energy
TA = 25 °C 3.1
Maximum Power DissipationPDW
74TC = 25 °C
dV/dt 5.3V/ns Peak Diode Recovery dV/dtc, e- 55 to + 150Operating Junction and Storage Temperature RangeTJ, Tstg
°C
Soldering Recommendations (Peak Temperature)for 10 s300dNotes
a.Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11).b.Starting TJ = 25 °C, L = 18 mH, RG = 25 Ω, IAS = 5.0 A (see fig. 12).c.ISD ≤ 5.0 A, dI/dt ≤ 370 A/µs, VDD ≤ VDS, TJ ≤ 150 °C.d.1.6 mm from case.
e.Uses SiHF830A data and test conditions.
* Pb containing terminations are not RoHS compliant, exemptions may applyDocument Number: 91062S-81352-Rev. A, 16-Jun-08
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IRF830AS, IRF830AL, SiHF830AS, SiHF830AL
Vishay Siliconix
THERMAL RESISTANCE RATINGS
PARAMETER SYMBOLMaximum Junction-to-Ambient (PCB Mounted, steady-state)a
Maximum Junction-to-Case (Drain)
RthJARthJC
TYP.--NMAX.UIT401.7
°C/W
Note
a.When mounted on 1\" square PCB (FR-4 or G-10 material).
SPECIFICATIONSTJ = 25 °C, unless otherwise notedPARAMETER SYMBOLNNTEST CONDITIOS NMI.TYP.MAX.UITStaticDrain-Source Breakdown Voltage VDS Temperature Coefficient Gate-Source Threshold Voltage Gate-Source Leakage Zero Gate Voltage Drain Current Drain-Source On-State Resistance Forward Transconductance DynamicInput Capacitance Output Capacitance Reverse Transfer Capacitance Output Capacitance Effective Output Capacitance Total Gate Charge Gate-Source Charge Gate-Drain ChargeTurn-On Delay Time Rise TimeTurn-Off Delay Time Fall Time Drain-Source Body Diode CharacteristicsContinuous Source-Drain Diode Current Pulsed Diode Forward CurrentaBody Diode VoltageBody Diode Reverse Recovery TimeBody Diode Reverse Recovery ChargeForward Turn-On TimeISISMVSDtrrQrrtonMOSFET symbolshowing the integral reversep - n junction diodeVDS ΔVDS/TJ VGS(th)IGSS IDSS RDS(on) gfs Ciss VGS = 0 V, ID = 250 µA Reference to 25 °C, ID = 1 mAdVDS = VGS, ID = 250 µA VGS = ± 30 VVDS = 500 V, VGS = 0 V VDS = 400 V, VGS = 0 V, TJ = 125 °C VGS = 10 VID = 3.0 AbVDS = 50 V, ID = 3.0 Ad500-2.0----2.8--------------0.60------620934.38862739---10212115--4.5± 100252501.4-------246.311----V V/°C V nA µA ΩS VGS = 0 V, Coss VDS = 25 V, f = 1.0 MHz, see fig. 5d Crss Coss Coss eff.Qg ID = 5.0 A, VDS = 400 V, Qgs VGS = 10 V see fig. 6 and 13b, dQgd td(on) VDD = 250 V, ID = 5.0 A, RG = 14 Ω, RD = 49 Ω, see fig. 10b, dtd(off) tf tr VDS = 1.0 V, f = 1.0 MHzVGS = 0 VVDS = 400 V, f = 1.0 MHzVDS = 0 V to 400 Vc, dpFnC ns--------4302.05.0A201.56503.0VnsµCTJ = 25 °C, IS = 5.0 A, VGS = 0 VbTJ = 25 °C, IF = 5.0 A, dI/dt = 100 A/µsb, dIntrinsic turn-on time is negligible (turn-on is dominated by LS and LD)Notes
a.Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11).b.Pulse width ≤ 300 µs; duty cycle ≤ 2 %.
c.Coss eff. is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80 % VDS.d.Uses SiHF830A data and test conditions.
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Document Number: 91062S-81352-Rev. A, 16-Jun-08
IRF830AS, IRF830AL, SiHF830AS, SiHF830AL
Vishay Siliconix
TYPICAL CHARACTERISTICS25 °C, unless otherwise noted
102ID, Drain-to-Source Current (A)10ID, Drain-to-Source Current (A)1VGSTop15 V10 V8.0 V7.0 V6.0 V5.5 V5.0 VBottom4.5 V4.5 V10210TJ = 150 °CTJ = 25 °C10.120 µs Pulse WidthTJ = 25 °C0.111010210-291062_010.14.091062_0320 µs Pulse WidthVDS = 50 V5.06.07.08.0VDS, Drain-to-Source Voltage (V)Fig. 1 - Typical Output Characteristics
VGS, Gate-to-Source Voltage (V)Fig. 3 - Typical Transfer Characteristics
ID, Drain-to-Source Current (A)VGSTop15 V10 V8.0 V7.0 V106.0 V5.5 V5.0 VBottom4.5 V14.5 VRDS(on), Drain-to-Source On Resistance(Normalized)1022.5ID = 5.0 AVGS = 10 V2.01.51.00.50.1191062_0220 µs Pulse WidthTJ = 150 °C101020.0- 60- 40- 20020406080100120140160VDS, Drain-to-Source Voltage (V)Fig. 2 - Typical Output Characteristics
91062_04TJ, Junction Temperature (°C)Fig. 4 - Normalized On-Resistance vs. Temperature
Document Number: 91062S-81352-Rev. A, 16-Jun-08
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IRF830AS, IRF830AL, SiHF830AS, SiHF830AL
Vishay Siliconix
104C, Capacitance (pF)103ISD, Reverse Drain Current (A)VGS = 0 V, f = 1 MHzCiss = Cgs + Cgd, Cds ShortedCrss = CgdCoss = Cds + CgdCiss10210TJ = 150 °C102Coss10Crss11101021031TJ = 25 °C0.10.291062_07VGS = 0 V0.40.60.81.01.291062_05VDS, Drain-to-Source Voltage (V)VSD, Source-to-Drain Voltage (V)Fig. 5 - Typical Capacitance vs. Drain-to-Source VoltageFig. 7 - Typical Source-Drain Diode Forward Voltage
20VGS, Gate-to-Source Voltage (V)ID = 5.0 AVDS = 400 V10216Operation in this area limitedby RDS(on)10 µs100 µs1 ms10 msID, Drain Current (A)VDS = 250 VVDS = 100 V101281TC = 25 °CTJ = 150 °CSingle Pulse101024For test circuitsee figure 130091062_060.1481216202491062_08103104QG, Total Gate Charge (nC)VDS, Drain-to-Source Voltage (V)Fig. 8 - Maximum Safe Operating Area
Fig. 6 - Typical Gate Charge vs. Gate-to-Source Voltage
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Document Number: 91062S-81352-Rev. A, 16-Jun-08
IRF830AS, IRF830AL, SiHF830AS, SiHF830AL
Vishay Siliconix
RDVDSVGS5.0RGD.U.T.+-VDDID, Drain Current (A)4.010 VPulse width ≤ 1 µsDuty factor ≤ 0.1 % 3.0Fig. 10a - Switching Time Test Circuit
2.0VDS1.090 %0.02591062_095075100125150TC, Case Temperature (°C)10 %VGStd(on)trtd(off)tfFig. 9 - Maximum Drain Current vs. Case Temperature
Fig. 10b - Switching Time Waveforms
10Thermal Response (ZthJC)1D = 0.500.200.10PDMt1t2Single Pulse(Thermal Response)10-410-310-2Notes:1. Duty Factor, D = t1/t22. Peak Tj = PDM x ZthJC + TC0.110.10.050.020.0110-210-591062_11t1, Rectangular Pulse Duration (s)Fig. 11 - Maximum Effective Transient Thermal Impedance, Junction-to-Case
15 VVDStpVDSLDriverRG20 VD.U.T.IAStp0.01 Ω+A-VDDIASFig. 12b - Unclamped Inductive Waveforms
Fig. 12a - Unclamped Inductive Test CircuitDocument Number: 91062
S-81352-Rev. A, 16-Jun-08www.vishay.com
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IRF830AS, IRF830AL, SiHF830AS, SiHF830AL
Vishay Siliconix
EAS, Single Pulse Avalanche Energy (mJ)500400VDSav, Avalanche Voltage (V)IDTop2.2 A3.2 ABottom5.0 A79078530078020010077502550751001251507700.091062_12d1.02.03.04.05.091062_12cStarting TJ, Junction Temperature (°C)IAV, Avalanche Current (A)Fig. 12d - Basic Gate Charge Waveform
Fig. 12c - Maximum Avalanche Energy vs. Drain Current
Current regulatorSame type as D.U.T.QG12 V0.2 µF0.3 µF50 kΩVGSQGSQGDD.U.T.+-VDSVGVGS3 mAChargeIGIDCurrent sampling resistorsFig. 13a - Maximum Avalanche Energy vs. Drain CurrentFig. 13b - Gate Charge Test Circuit
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Document Number: 91062S-81352-Rev. A, 16-Jun-08
IRF830AS, IRF830AL, SiHF830AS, SiHF830AL
Vishay Siliconix
Peak Diode Recovery dV/dt Test CircuitD.U.T.+Circuit layout considerations • Low stray inductance • Ground plane • Low leakage inductance current transformer-+-+-RG• dV/dt controlled by RG• Driver same type as D.U.T.• ISD controlled by duty factor \"D\"• D.U.T. - device under test+-VDDDriver gate driveP.W.PeriodD = P.W.PeriodVGS = 10 V* D.U.T. ISDwaveformReverserecoverycurrentBody diode forwardcurrentdI/dtD.U.T. VDSwaveformDiode recoverydV/dtVDDRe-appliedvoltageInductor currentBody diode forward dropRipple≤5 %ISD* VGS = 5 V for logic level devicesFig. 14 - For N-Channel
Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for SiliconTechnology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, andreliability data, see www.vishay.com/ppg?91062.
Document Number: 91062S-81352-Rev. A, 16-Jun-08
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Vishay
Disclaimer
All product specifications and data are subject to change without notice.
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Document Number: 91000Revision: 18-Jul-08
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