专利名称：POWER SUPPLY APPARATUS FOR TEST
APPARATUS
发明人：Takahiko Shimizu,Katsuhiko Degawa申请号：US13402502申请日：20120222
公开号：US20120218004A1公开日：20120830
专利附图：
摘要：A first A/D converter converts an analog observed value, which corresponds toa power supply signal supplied to a power supply terminal of a DUT, into a digitalobserved value. By means of digital calculation processing, a digital signal processing
circuit generates a control value that is adjusted such that the digital observed valuematches a predetermined reference value. A first D/A converter supplies, via a powersupply line to the power supply terminal of the DUT, an analog power supply signalobtained by performing digital/analog conversion of the control value. A load estimatingunit applies a test signal containing a predetermined frequency component via the powersupply line to a node via which the power supply terminal is to be connected, andgenerates a control parameter for the digital signal processing circuit according to thetest signal and the observed signal.
申请人：Takahiko Shimizu,Katsuhiko Degawa
地址：Tokyo JP,Tokyo JP
国籍：JP,JP
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