专利名称：DEVICE AND METHOD FOR FAULT
MANAGEMENT OF SMART DEVICE
发明人：Yong-Hyuk MOON,Jeong-Nyeo KIM,Bo-Heung CHUNG,Jin-Hee HAN,Dae-WonKIM,Hwa-Shin MOON
申请号：US14028486申请日：20130916
公开号：US20140115400A1公开日：20140424
专利附图：
摘要：There is provided a method of fault management of a smart device including
comparing a value of a fault detection indicator (hereinafter referred to as ‘FDI’) in anormal state, which detects faults generated in the smart device, with respect to at leastone performance indicator, with an FDI value observed in real time and detecting thefaults by calculating a relative variation level of the observed values, and creating adiagnosis object (hereinafter referred to as ‘DO’) including a cause and acountermeasure of the detected fault and analyzing the fault.
申请人：Electronics and Telecommunications Research Institute
地址：Daejeon KR
国籍：KR
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