专利名称:Method and apparatus for calibrating and
certifying accuracy of a wavefront sensingdevice
发明人:Griffith E. Altmann申请号:US10013573申请日:20011211公开号:US06739721B2公开日:20040525
专利附图:
摘要:A calibration component for use in calibrating and certifying the accuracy of anophthalmic wavefront sensor comprises a monolithic, plano-convex refractive optic having
known amounts of one or more selected aberrations induced by the spherical,axisymmetric aspherical, or non-axisyrmmetric aspherical convex surface. An alignmenttool is described, along with a procedure for calibrating an aberrometer.
申请人:BAUSCH AND LOMB, INC
代理人:Craig E. Larson
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