专利名称：Arrangement for adapting the contact grid
spacing in a printed circuit testing device
发明人：Driller, Hubert, Dipl.-Phys.,Mang, Paul申请号：EP84113375.4申请日：19841106公开号：EP0142119A1公开日：19850522
摘要：the invention concerns an arrangement for changing the kontaktabst\ändea kontaktfeldrasters a leiterplattenpr\üfger\ät (ausgangsraster) to anotherkontaktdichte (endraster).it is characterized by the fact that a number of printed circuitboards with two mutually opposite parallel long edges is provided, each with a numberof contact points weartheir distance apart on the long end of the kontaktabstandausgangsrasters and at the other end of the long kontaktabstand endrasterscorrespondswith each other on the two long edges which contact with traces on theleiterplattenoberfl\äche are linked to each other: this is the first part of thisleiterpslats at a first level in parallel with the ausgangsraster corresponding contactpoints it is running lengthwise on the kontaktfeldraster aufliegend orderedand thesecond part of this circuit in a first level and second level parallel aligned with theircorresponding points of contact in the ausgangsraster orit is running on the commitmentendrasterabstand corresponding contact points of the first level aufliegend ordered.
申请人：MANIA Elektronik Automatisation Entwicklung und Gerätebau GmbH,Mang,Paul
地址：Hauptstrasse 86 D-6384 Schmitten 2 DE,Weilbergstrasse 4 61389 Schmitten DE
国籍：DE,DE
代理机构：Ruschke, Hans Edvard
更多信息请下载全文后查看
因篇幅问题不能全部显示，请点此查看更多更全内容