专利名称：On-chip self-test circuit发明人：Phuc C. Pham,Paul B. Sofianos申请号：US07/782955申请日：19911025公开号：US05202626A公开日：19930413
摘要：An on-chip self-test circuit has been provided that allows for accurately testinga device such as prescaler at high frequencies. The on- chip self-test circuit includes avoltage controlled oscillator for providing high frequency signals to the device undertest.
< P>The on-chip self-test circuit is rendered active only when one desires to test thedevice. Thus, when not testing, the on-chip self-test circuit is transparent to the deviceand consumes substantially zero power.
申请人：MOTOROLA, INC.
代理人：Bradley J. Botsch, Sr.
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